IEEE - Institute of Electrical and Electronics Engineers, Inc. - Two sparsity-controlled schemes for 1-norm support vector classification

2007 International IEEE Northeast Workshop on Circuits and Systems (NEWCAS '07)

Author(s): Shih-Yu Chiu ; Leu-Shing Lan ; Yu-Cheng Hwang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que, Canada
Conference Date: 5 August 2007
Page(s): 337 - 340
ISBN (CD): 978-1-4244-1164-1
ISBN (Paper): 978-1-4244-1163-4
DOI: 10.1109/NEWCAS.2007.4487961
Regular:

Support vector machines (SVMs) are currently a very active research area for machine learning, data mining, etc. Sparsity control is an issue deserving further attention for the improvement of... View More

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