IEEE - Institute of Electrical and Electronics Engineers, Inc. - Preparation and characterization for nanodiamond thin film for electronic field emission applications

20th International Vacuum Nanoelectronics Conference

Author(s): J. Chen ; F.Y. Xie ; W.G. Xie ; X. Liu ; W.H. Zhang ; S.Z. Deng ; N.S. Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Chicago, IL, USA
Conference Date: 8 July 2007
Page(s): 229 - 230
ISBN (CD): 978-1-4244-1134-4
ISBN (Paper): 978-1-4244-1133-7
DOI: 10.1109/IVNC.2007.4481008
Regular:

In this work, we investigated the preparation and characterization of nanodiamond thin films on silicon substrate and then studied the electron field emission. We concluded that nanodiamond... View More

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