IEEE - Institute of Electrical and Electronics Engineers, Inc. - Role of dielectric for field emission at the metal-dielectric-vacuum triple junction

20th International Vacuum Nanoelectronics Conference

Author(s): M.S. Chung ; H.K. Bae ; A. Mayer ; P.H. Cutler ; N.M. Miskovsky
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Chicago, IL, USA
Conference Date: 8 July 2007
Page(s): 153 - 154
ISBN (CD): 978-1-4244-1134-4
ISBN (Paper): 978-1-4244-1133-7
DOI: 10.1109/IVNC.2007.4480975
Regular:

In this paper the field emission enhancement at the dielectric-metal contact is theoretically investigated. Even though such a strange phenomenon as vacuum breakdown has been reported for half a... View More

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