IEEE - Institute of Electrical and Electronics Engineers, Inc. - The detailed analysis of field emission under stabilized operation using field effect transistor

20th International Vacuum Nanoelectronics Conference

Author(s): Y. Neo ; T. Matsumoto ; H. Shimawaki ; H. Mimura ; K. Yokoo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Chicago, IL, USA
Conference Date: 8 July 2007
Page(s): 125 - 126
ISBN (CD): 978-1-4244-1134-4
ISBN (Paper): 978-1-4244-1133-7
DOI: 10.1109/IVNC.2007.4480961
Regular:

In this report, the effect of field enhancement factor modulation and tip potential controlled by FET were described. The field enhancement factor: beta is easily controlled by potential... View More

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