IEEE - Institute of Electrical and Electronics Engineers, Inc. - XPS and LEED analyses on the extremely low work function surface of W(100) modified by yttrium oxide.

20th International Vacuum Nanoelectronics Conference

Author(s): T. Kawakubo ; Y. Shimoyama ; H. Nakane ; H. Adachi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Chicago, IL, USA
Conference Date: 8 July 2007
Page(s): 20 - 21
ISBN (CD): 978-1-4244-1134-4
ISBN (Paper): 978-1-4244-1133-7
DOI: 10.1109/IVNC.2007.4480915
Regular:

XPS and LEED analyses have been done for tungsten (100) surface modified by use of Y2O3. No shift in Y-3d XPS peak is observed for heat treatment, suggesting that Y-O... View More

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