IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of Electromagnetic Leakages throughout the Connector Shell

11th IEEE Workshop on Signal Propagation on Interconnects

Author(s): Y. Bouri ; L. Kone ; J. Razafiarivelo ; D. Baudry ; S. Baranowski ; B. Demoulin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Genova, Italy
Conference Date: 13 May 2007
Page(s): 109 - 112
ISBN (CD): 978-1-4244-1224-2
ISBN (Paper): 978-1-4244-1223-5
DOI: 10.1109/SPI.2007.4512224
Regular:

The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be... View More

Advertisement