IEEE - Institute of Electrical and Electronics Engineers, Inc. - Soft-error induced system-failure rate analysis in an SoC

2007 NORCHIP Conference

Author(s): S.M. Tony ; H. Mohammad ; J. Mathew ; D.K. Pradhan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Aalborg, Denmark
Conference Date: 19 November 2007
Page(s): 1 - 4
ISBN (CD): 978-1-4244-1517-5
ISBN (Paper): 978-1-4244-1516-8
DOI: 10.1109/NORCHP.2007.4481075
Regular:

This paper proposes an analytical method to assess the soft-error rate (SER) in the early stages of a System-on-Chip (SoC) platform-based design methodology. The proposed method gets an executable... View More

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