IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical analysis of steady state leakage currents in nano-CMOS devices

2007 NORCHIP Conference

Author(s): J. Singh ; J. Mathew ; S.P. Mohanty ; D.K. Pradhan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Aalborg, Denmark
Conference Date: 19 November 2007
Page(s): 1 - 4
ISBN (CD): 978-1-4244-1517-5
ISBN (Paper): 978-1-4244-1516-8
DOI: 10.1109/NORCHP.2007.4481069
Regular:

Motivated by the problem of process variation in nano-scale CMOS, in this paper, we propose a multivariate statistical technique that uses the well known approach of principal component analysis... View More

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