IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect tolerant ganged CMOS minority gate

2007 NORCHIP Conference

Author(s): A. Djupdal ; P.C. Haddow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Aalborg, Denmark
Conference Date: 19 November 2007
Page(s): 1 - 4
ISBN (CD): 978-1-4244-1517-5
ISBN (Paper): 978-1-4244-1516-8
DOI: 10.1109/NORCHP.2007.4481060
Regular:

Production defects, resulting in faulty transistors, provide a challenge for the semiconductor industry in terms of reduced Yield. As defect densities are expected to increase as the... View More

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