IEEE - Institute of Electrical and Electronics Engineers, Inc. - Potential and Electric Field Distribution Analysis of Field Limiting Ring and Field Plate by Device Simulator

2007 International Conference on Power Electronics and Drive Systems (PEDS '07)

Author(s): C.N. Liao ; F.T. Chien ; Y.T. Tsai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Bangkok, Thailand
Conference Date: 27 November 2007
Page(s): 451 - 455
ISBN (CD): 978-1-4244-0645-6
ISBN (Paper): 978-1-4244-0644-9
DOI: 10.1109/PEDS.2007.4487739
Regular:

Potential and strength of surface electric field distribution have strongly influence on breakdown voltage and reliability of power semiconductor devices. Potential distribution can be determined... View More

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