IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of Internal Feedback and Gate-Drive Signal on the Turn-off Loss of MOSFET ZVS

2007 International Conference on Power Electronics and Drive Systems (PEDS '07)

Author(s): Y. Kulvitit ; P. Opanuruk ; T. Tansatit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Bangkok, Thailand
Conference Date: 27 November 2007
Page(s): 105 - 112
ISBN (CD): 978-1-4244-0645-6
ISBN (Paper): 978-1-4244-0644-9
DOI: 10.1109/PEDS.2007.4487686
Regular:

This paper studies the effects of internal feedback through device's parasitic capacitances and inductances associated with gate-drive signal on the turn-off loss of MOSFET operates as... View More

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