IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-line Junction Temperature Measurement of CoolMOS Devices

2007 International Conference on Power Electronics and Drive Systems (PEDS '07)

Author(s): A. Koenig ; T. Plum ; P. Fidler ; R.W. De Doncker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Bangkok, Thailand
Conference Date: 27 November 2007
Page(s): 90 - 95
ISBN (CD): 978-1-4244-0645-6
ISBN (Paper): 978-1-4244-0644-9
DOI: 10.1109/PEDS.2007.4487683
Regular:

To operate power electronic devices at high ambient temperatures it has to be ensured that the maximum specified junction temperature is not exceeded at any time during operation. This paper... View More

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