IEEE - Institute of Electrical and Electronics Engineers, Inc. - Toward optimal selection of feature clusters

2007 International Conference on Machine Learning and Applications

Author(s): Lei Yu ; Hao Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Cincinnati, OH, USA
Conference Date: 13 December 2007
Page(s): 417 - 422
ISBN (Paper): 978-0-7695-3069-7
DOI: 10.1109/ICMLA.2007.93
Regular:

In microarray data analysis, the large number of equally predictive gene sets and the disparity among them reveals the gap between necessary genes for accurate models and candidate genes for... View More

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