IEEE - Institute of Electrical and Electronics Engineers, Inc. - Soft Failure Detection Using Factorial Hidden Markov Models

2007 International Conference on Machine Learning and Applications

Author(s): G. Bouchard ; J.-M. Andreoli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Cincinnati, OH, USA
Conference Date: 13 December 2007
Page(s): 160 - 165
ISBN (Paper): 978-0-7695-3069-7
DOI: 10.1109/ICMLA.2007.79
Regular:

In modern business, educational, and other settings, it is common to provide a digital network that interconnects hardware devices for shared access by the users (e.g., in an office where printers... View More

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