IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of the Effect of Digital Power Ground Noise on Active Balun in UHF RFID SiP
2007 9th Electronics Packaging Technolgy Conference
Author(s): | Jiwoon Park ; Chunghyun Ryu ; Changwook Yoon ; Kyoungchoul Koo ; Joungho Kim |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 December 2007 |
Conference Location: | Singapore, Singapore |
Conference Date: | 10 December 2007 |
Page(s): | 586 - 590 |
ISBN (CD): | 978-1-4244-1323-2 |
ISBN (Paper): | 978-1-4244-1324-9 |
DOI: | 10.1109/EPTC.2007.4469737 |
Regular:
In recent, as the demand for integrating radio frequency identification (RFID) system to mobile electric appliances increases, there has been strong needs for small size, light weight, and low... View More