IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of the Effect of Digital Power Ground Noise on Active Balun in UHF RFID SiP

2007 9th Electronics Packaging Technolgy Conference

Author(s): Jiwoon Park ; Chunghyun Ryu ; Changwook Yoon ; Kyoungchoul Koo ; Joungho Kim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Singapore, Singapore
Conference Date: 10 December 2007
Page(s): 586 - 590
ISBN (CD): 978-1-4244-1323-2
ISBN (Paper): 978-1-4244-1324-9
DOI: 10.1109/EPTC.2007.4469737
Regular:

In recent, as the demand for integrating radio frequency identification (RFID) system to mobile electric appliances increases, there has been strong needs for small size, light weight, and low... View More

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