IEEE - Institute of Electrical and Electronics Engineers, Inc. - “DC-grade” reliability for UPS in telecommunications data centers

International Telecommunications Energy Conference

Author(s): F. Bodi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Rome, Italy
Conference Date: 30 September 2007
Page(s): 595 - 602
ISBN (CD): 978-1-4244-1628-8
ISBN (Paper): 978-1-4244-1627-1
DOI: 10.1109/INTLEC.2007.4448849
Regular:

Data Center reliability and the soaring cost of infrastructure are of major concern to businesses and Telcos. Traditionally data centers have been UPS-powered however on reliability grounds UPS... View More

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