IEEE - Institute of Electrical and Electronics Engineers, Inc. - Direct In-junction Characterization of Molecular Switching Devices Based on Self-Assembled Monolayer Embedded in Nanowire Junction

Microprocesses and Nanotechnology 2007. 20th International Microprocesses and Nanotechnology Conference

Author(s): M. Maitani ; Heayoung Yoon ; Lintao Cai ; O.M. Cabarcos ; T.S. Mayer ; D.L. Allara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kyoto, Japan
Conference Date: 5 November 2007
Page(s): 492 - 493
ISBN (Paper): 978-4-9902472-4-9
DOI: 10.1109/IMNC.2007.4456319
Regular:

In this paper, we report the direct in-junction characterization of OAn SAM embedded in the crossed-wire junction structure which is more reliable and available for spectroscopic analysis to... View More

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