IEEE - Institute of Electrical and Electronics Engineers, Inc. - In-situ visualization of local fields at a sharp tungsten emitter using low-voltage scanning transmission electron microscope

Microprocesses and Nanotechnology 2007. 20th International Microprocesses and Nanotechnology Conference

Author(s): J. Fujita ; Y. Ikeda ; T. Ichihasi ; S. Matsui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kyoto, Japan
Conference Date: 5 November 2007
Page(s): 466 - 467
ISBN (Paper): 978-4-9902472-4-9
DOI: 10.1109/IMNC.2007.4456306
Regular:

In this paper, we demonstrate that the local electric field distribution at a sharp tip can be drawn as a contour map and it agrees well with numerical calculations based on finite element method... View More

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