IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of the AFM tweezers system

Microprocesses and Nanotechnology 2007. 20th International Microprocesses and Nanotechnology Conference

Author(s): K. Ayano ; M. Suzuki ; M. Yasutake ; T. Umemoto ; G. Hashiguchi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kyoto, Japan
Conference Date: 5 November 2007
Page(s): 276 - 277
ISBN (Paper): 978-4-9902472-4-9
DOI: 10.1109/IMNC.2007.4456211
Regular:

A new class of atomic force microscope (AFM) which provides tweezers function in addition to atomic force observation is described. In order to integrate a function of nano-manipulation with AFM,... View More

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