IEEE - Institute of Electrical and Electronics Engineers, Inc. - First-Principle Study on Piezoresistance Effect in Silicon Nanowires

Microprocesses and Nanotechnology 2007. 20th International Microprocesses and Nanotechnology Conference

Author(s): K. Nakamura ; Y. Isono ; T. Toriyama
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kyoto, Japan
Conference Date: 5 November 2007
Page(s): 268 - 269
ISBN (Paper): 978-4-9902472-4-9
DOI: 10.1109/IMNC.2007.4456207
Regular:

In this study, we have simulated the piezoresistance effect in bulk silicon and silicon nanowires (SiNWs) based on the first-principle calculations of model structures. The band structure changes... View More

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