IEEE - Institute of Electrical and Electronics Engineers, Inc. - Charging properties of Si nanocrystals with respect to the varied temperature

Microprocesses and Nanotechnology 2007. 20th International Microprocesses and Nanotechnology Conference

Author(s): H. Yang ; S.Y. Sung ; Y.J. Choi ; J.W. Kim ; Y.S. Kim ; C.J. Kang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kyoto, Japan
Conference Date: 5 November 2007
Page(s): 246 - 247
ISBN (Paper): 978-4-9902472-4-9
DOI: 10.1109/IMNC.2007.4456196
Regular:

In this work, we analyzed electrical properties of Si nanocrystals (NCs) using scanning capacitance microscopy (SCM). Charging, discharging effects of a NC with respect to the various temperatures... View More

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