IEEE - Institute of Electrical and Electronics Engineers, Inc. - Emission Property and Structure of an Ultra Sharp Tungsten Probe

Microprocesses and Nanotechnology 2007. 20th International Microprocesses and Nanotechnology Conference

Author(s): Y. Ikeda ; K. Higashi ; S. Nakazawa ; T. Ichihashi ; S. Matsui ; J.-i. Fujita
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kyoto, Japan
Conference Date: 5 November 2007
Page(s): 22 - 23
ISBN (Paper): 978-4-9902472-4-9
DOI: 10.1109/IMNC.2007.4456085
Regular:

It was previously reported that an ultra sharp emitter can be fabricated during field emissions from a multi-walled carbon nanotube embedded in a conventional electrolytic polished tungsten probe,... View More

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