IEEE - Institute of Electrical and Electronics Engineers, Inc. - Chemical Force AFM with CNT Tips

Microprocesses and Nanotechnology 2007. 20th International Microprocesses and Nanotechnology Conference

Author(s): H. Tokumoto ; K. Ide ; K. Ukita ; H. Azehara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kyoto, Japan
Conference Date: 5 November 2007
Page(s): 20 - 21
ISBN (Paper): 978-4-9902472-4-9
DOI: 10.1109/IMNC.2007.4456084
Regular:

In this paper, we focus on preparation of CNT-AFM tips, their chemical modification, and their application. The authors have been trying to use a carbon nanotube (CNT) as an AFM probe tip because... View More

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