IEEE - Institute of Electrical and Electronics Engineers, Inc. - Poisoning fault diagnosis in chemical gas sensor arrays using multivariate statistical signal processing and structured residuals generation

2007 IEEE International Symposium on Intelligent Signal Processing

Author(s): M. Padilla ; A. Perera ; I. Montoliu ; A. Chaudry ; K. Persaud ; S. Marco
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Alcala de Henares, Spain
Conference Date: 3 October 2007
Page(s): 1 - 6
ISBN (CD): 978-1-4244-0830-6
ISBN (Paper): 978-1-4244-0829-0
DOI: 10.1109/WISP.2007.4447638
Regular:

Chemical gas sensors are a cheaper and faster alternative for gas analysis than conventional analytic instruments. .However they are prone to degradation because of sensor poisoning and drift.... View More

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