IEEE - Institute of Electrical and Electronics Engineers, Inc. - A high repetition rate VUV-soft X-ray FEL concept

2007 IEEE Particle Accelerator Conference

Author(s): J. Corlett ; J. Byrd ; W.M. Fawley ; M. Gullans ; D. Li ; S.M. Lidia ; H. Padmore ; G. Penn ; I. Pogorelov ; J. Qiang ; D. Robin ; F. Sannibale ; J.W. Staples ; C. Steier ; M. Venturini ; S. Virostek ; W. Wan ; R. Wells ; R. Wilcox ; J. Wurtele ; A. Zholents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 25 June 2007
Page(s): 1,167 - 1,169
ISBN (Paper): 978-1-4244-0916-7
ISSN (Electronic): 2152-9582
ISSN (Paper): 1944-4680
DOI: 10.1109/PAC.2007.4441018
Regular:

We report on design studies for a seeded FEL light source that is responsive to the scientific needs of the future. The FEL process increases radiation flux by several orders of magnitude above... View More

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