IEEE - Institute of Electrical and Electronics Engineers, Inc. - High performance EBIS for RHIC

2007 IEEE Particle Accelerator Conference

Author(s): J. Alessi ; E. Beebe ; O. Gould ; A. Kponou ; R. Lockey ; A. Pikin ; D. Raparia ; J. Ritter ; L. Snydstrup
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 25 June 2007
Page(s): 3,782 - 3,785
ISBN (Paper): 978-1-4244-0916-7
DOI: 10.1109/PAC.2007.4440116
Regular:

An electron beam ion source (EBIS), capable of producing high charge states and high beam currents of any heavy ion species in short pulses, is ideally suited for injection into a synchrotron. An... View More

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