IEEE - Institute of Electrical and Electronics Engineers, Inc. - Non-destructive single shot bunch length measurements for the CLIC Test Facility 3

2007 IEEE Particle Accelerator Conference

Author(s): A. Dabrowski ; M. Velasco ; H.H. Braun ; R. Corsini ; S. Dobert ; T. Lefevre ; F. Tecker ; P. Urschutz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 25 June 2007
Page(s): 4,069 - 4,071
ISBN (Paper): 978-1-4244-0916-7
DOI: 10.1109/PAC.2007.4440055
Regular:

A non-destructive bunch length detector has been installed in the CLIC test facility (CTF3). Using a series of down-converting mixing stages and filters, the detector analyzes the power spectrum... View More

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