IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the saturation of n-detection test sets with increased n

International Test Conference 2007

Author(s): I. Pomeranz ; S. Reddy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Santa Clara, CA, USA
Conference Date: 21 October 2007
Page(s): 1 - 10
ISBN (CD): 978-1-4244-1128-3
ISBN (Paper): 978-1-4244-1127-6
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2007.4437647
Regular:

An n-detection test set contains n different tests for each target fault. The value of n is typically determined based on test set size constraints, and certain values have become standard. In... View More

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