IEEE - Institute of Electrical and Electronics Engineers, Inc. - Generation of Power-Constrained Scan Tests and Its Difficulty

2nd International Design and Test Workshop, IDT 2007

Author(s): T. Iwagaki ; S. Ohtake
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Cairo, Egypt
Conference Date: 16 December 2007
Page(s): 71 - 76
ISBN (CD): 978-1-4244-1825-1
ISBN (Paper): 978-1-4244-1824-4
DOI: 10.1109/IDT.2007.4437432
Regular:

This paper proposes a test generation framework to generate stuck-at tests for a scan circuit under both peak shift and capture power limits. A concept of "complete fault efficiency under a power... View More

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