IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reduction of the streak artifacts in circular cone beam CT using scanograms

2007 IEEE Nuclear Science Symposium

Author(s): Yu Zou ; A.A. Zamyatin ; B.S. Chiang ; M.D. Silver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 5
Page(s): 3,531 - 3,536
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436890
Regular:

We propose a method to estimate line data from scanogram in a CT scan. Combining the circle data with the estimated line data, we can reconstruct the volumetric images by use of an exact filtered... View More

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