IEEE - Institute of Electrical and Electronics Engineers, Inc. - CMOS compatible through wafer interconnects for medical imaging detectors

2007 IEEE Nuclear Science Symposium

Author(s): G. Vogtmeier ; C. Drabe ; R. Dorscheid ; R. Steadman ; W. Jeroch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 5
Page(s): 3,430 - 3,435
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436867
Regular:

Modern medical imaging systems like computed tomography (CT) require advanced technologies for the imaging sensor and processing electronics as well as for the packaging technologies to build an... View More

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