IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reduction of micro-SPECT streak artifacts from imperfect system modeling

2007 IEEE Nuclear Science Symposium

Author(s): S.C. Moore ; M. MacKnight ; Mi-Ae Park ; R.E. Zimmerman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 5
Page(s): 3,361 - 3,363
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436852
Regular:

In micro-SPECT imaging, it can be challenging to model accurately the peripheral regions of a pinhole's response function, which correspond to large photon angles of incidence on the pinhole... View More

Advertisement