IEEE - Institute of Electrical and Electronics Engineers, Inc. - Image noise properties in circular sinusoid cone-beam CT

2007 IEEE Nuclear Science Symposium

Author(s): Dan Xia ; Seungryong Cho ; Xiaochuan Pan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 4
Page(s): 3,082 - 3,084
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436781
Regular:

Recently, a reduced circular sinusoid scan was proposed in which data are collected only over an open portion of the full circular sinusoid trajectory. In general, for reconstructing the same ROI... View More

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