IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reduced-scan schemes for X-ray fluorescence computed tomography

2007 IEEE Nuclear Science Symposium

Author(s): P.J. La Riviere ; P. Vargas ; M. Newville ; S.R. Sutton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 4
Page(s): 2,991 - 2,995
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436763
Regular:

X-ray fluorescence computed tomography (XFCT) is a synchrotron-based imaging modality employed for mapping the distribution of elements within slices or volumes of intact specimens. A pencil beam... View More

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