IEEE - Institute of Electrical and Electronics Engineers, Inc. - Maximum likelihood resolution recovery in X-ray CT with an extended focal spot

2007 IEEE Nuclear Science Symposium

Author(s): J.W. Stayman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 4
Page(s): 2,644 - 2,645
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436690
Regular:

This paper presents a method for recovering resolution in X-ray computed tomographic (CT) systems where the projection of an extended focal spot onto the detector results in significant blur. This... View More

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