IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurements of charge sharing effects in pixilated CZT/CdTe detectors

2007 IEEE Nuclear Science Symposium

Author(s): I. Kuvvetli ; C. Budtz-Jargensen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 3
Page(s): 2,252 - 2,257
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436596
Regular:

In this paper, charge sharing and charge loss effects in pixilated CZT/CdTe detectors are investigated by measurements. We measured charge sharing effects function of the inter-pixel gap (with... View More

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