IEEE - Institute of Electrical and Electronics Engineers, Inc. - Capacitance simulations and measurements of 3D pixel sensors under 55 MeV proton exposure

2007 IEEE Nuclear Science Symposium

Author(s): J.E. Metcalfe ; I. Gorelov ; M. Hoeferkamp ; S. Seidel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 3
Page(s): 2,164 - 2,168
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436580
Regular:

3D pixel sensors are a novel type of silicon detector designed for high energy physics and other applications. Their features include high spatial resolution and radiation tolerance. The design... View More

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