IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 130nm CMOS digitizer prototype chip for Silicon strips detectors readout

2007 IEEE Nuclear Science Symposium

Author(s): W. Da Silva ; J. David ; M. Dhellot ; D. Fougeron ; J.-F. Genat ; R. Hermel ; J.-F. Huppert ; F. Kapusta ; H. Lebbolo ; T.-H. Pham ; F. Rossel ; A. Savoy-Navarro ; R. Sefri
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 3
Page(s): 1,861 - 1,864
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436520
Regular:

A 130 nm CMOS evaluation chip intended to read Silicon strip detectors has been designed and successfully tested. Optimized for a detector capacitance of 10 pF, it includes four channels of a full... View More

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