IEEE - Institute of Electrical and Electronics Engineers, Inc. - ATLAS muon Endcap MDT Chamber performance

2007 IEEE Nuclear Science Symposium

Author(s): C. Ferretti
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 3
Page(s): 1,836 - 1,843
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436515
Regular:

The test of the 432 ATLAS endcap monitored drift tube chambers of the muon spectrometer is completed. The results for almost 150,000 channels and more than 10,000 between electronic cards and... View More

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