IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of Te inclusions on the performance of CdZnTe radiation detectors

2007 IEEE Nuclear Science Symposium

Author(s): A.E. Bolotnikov ; N. Abdul-Jabber ; S. Babalola ; G.S. Camarda ; Y. Cui ; A. Hossain ; E. Jackson ; J. James ; K.T. Konman ; A. Luryi ; R.B. James
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 3
Page(s): 1,788 - 1,797
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436507
Regular:

Te inclusions existing at high concentrations in CdZnTe (CZT) material can degrade the performance of CZT detectors. These microscopic defects trap the free electrons generated by incident... View More

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