IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of CMOS monolithic pixel sensors with in-pixel correlated double sampling and fast readout for the ILC

2007 IEEE Nuclear Science Symposium

Author(s): M. Battaglia ; J.-M. Bussat ; D. Contarato ; P. Denes ; P. Giubilato ; L.E. Glesener
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 3
Page(s): 1,780 - 1,782
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436505
Regular:

This paper presents the design and results of detailed tests of a CMOS active pixel chip for charged particle detection with in-pixel charge storage and correlated double sampling readout in... View More

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