IEEE - Institute of Electrical and Electronics Engineers, Inc. - Photoelectron collection efficiency in Xe-CF 4 mixtures

2007 IEEE Nuclear Science Symposium

Author(s): J. Escada ; P.J.B. Rachinhas ; T.H.V. Dias ; J.A.M. Lopes ; F.P. Santos ; C.A.N. Conde ; A.D. Stauffer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 1
Page(s): 585 - 589
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436400
Regular:

A Monte Carlo simulation is used to study electron drift parameters in CF4 and Xe-CF4 mixtures as well as the collection efficiency f for photoelectrons emitted from a... View More

Advertisement