IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a GEM detector for X-Ray radiography of cultural properties

2007 IEEE Nuclear Science Symposium

Author(s): M. Inuzuka
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 1
Page(s): 579 - 580
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436398
Regular:

For in-situ investigation of materials and construction of cultural properties, a prototype detector consisting of GEM foils has been produced. This paper provides a concept of the detector... View More

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