IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi correlated double sampling with exponential reset

2007 IEEE Nuclear Science Symposium

Author(s): M. Porro ; S. Herrmann ; N. Hornel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Honolulu, HI, USA
Conference Date: 26 October 2007
Volume: 1
Page(s): 291 - 298
ISBN (CD): 978-1-4244-0923-5
ISBN (Paper): 978-1-4244-0922-8
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2007.4436333
Regular:

Multiple correlated double sampling is often used to readout detectors with known periodic signal arrival time. New high rate applications such as X-ray evolving universe spectroscopy mission... View More

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