IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compact, high performance femtosecond laser ablation system for trace element analysis

2007 Quantum Electronics and Laser Science Conference

Author(s): Eric Mottay ; Patrick Chabassier ; Christophe Pecheyran ; Fanny Claverie ; Olivier. F. X. Donard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431525
Regular:

We present a compact, industrial laser ablation system for trace element analysis. The system uses a high repetition rate femtosecond laser for material ablation and an inductively coupled mass... View More

Advertisement