IEEE - Institute of Electrical and Electronics Engineers, Inc. - Atomic frequency references based on dark resonances in micrometric thin cells

2007 Quantum Electronics and Laser Science Conference

Author(s): L. Lenci ; A. Lezama ; H. Failache
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431458
Regular:

Coherent population trapping resonances in pure alkaline micrometric thin cells are considered as an interesting alternative for the development of miniaturized atomic frequency references.... View More

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