IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detection of gold in the facet of a failed semiconductor laser diode

2007 Quantum Electronics and Laser Science Conference

Author(s): J.A. Chaney ; T.S. Yeoh ; N.A. Ives ; M.S. Leung ; Z.D. Feinberg ; J.G. Ho
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431370
Regular:

The damaged region of a failed semiconductor laser diode was analyzed using FIB nanotomography and 31) TOF-SIMS. Gold, a deep level trap, was found between the antireflective coating and the... View More

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