IEEE - Institute of Electrical and Electronics Engineers, Inc. - Observation of long-lived screening in low-temperature-grown GaAs photoconductive switches

2007 Quantum Electronics and Laser Science Conference

Author(s): G. Loata ; T. Loffler ; M. D. Thomson ; A. Lisauskas ; H. G. Roskos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431360
Regular:

A subgroup of photoexcited carriers in biased few-μm-sized LT-GaAs switches is shown to recombine on a time scale of nanoseconds. This can induce field screening amounting to tens of percent... View More

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