IEEE - Institute of Electrical and Electronics Engineers, Inc. - 97% top hat efficiency, 4 J/cm2 damage threshold compression gratings

2007 Quantum Electronics and Laser Science Conference

Author(s): F. Canova ; J. P. Chambaret ; O. Uteza ; P. Delaporte ; M. Tondusson ; E. Freysz ; O. Parriaux ; M. Flury ; S. Tonchev ; N. Lyndin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431349
Regular:

High diffraction efficiency all-dielectric pulse compression grating is reported with a close to 100% flat top over more than 20 nm spectral width around 800 nm wavelength and more than 4 J/cm2... View More

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