IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nondestructive internal device characterization of an oxide-confined vertical-cavity surface-emitting laser

2007 Quantum Electronics and Laser Science Conference

Author(s): V. de Lange ; K. Sun ; R. Gordon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431200
Regular:

A nondestructive method is presented to determine the internal properties of vertical-cavity surface-emitting lasers. The refractive index and oxide radius are extracted from the laser modes and... View More

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